FIELD EFFECT TRANSISTOR AND MANUFACTURE OF THE SAME

PROBLEM TO BE SOLVED: To provide FET having high breakdown strength between gate/drain and high mutual conductance and to provide a method for manufacturing FET with satisfactory reproducibility. SOLUTION: A gate electrode 13 constituted of WSi is formed on a GaAs substrate 11 where an n-layer 12 is...

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Bibliographic Details
Main Author UDA TOMOYA
Format Patent
LanguageEnglish
Published 15.08.1997
Edition6
Subjects
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