METHOD FOR ANALYZING SAMPLE, METHOD FOR PREPARING CALIBRATION CURVE, AND ANALYTICAL DEVICE USING THESE METHOD

• Main Authors: MAKINO YOSHIHIKO, HIRAI KIKUO
• Format: Patent
• Language: English
• Published: 22.07.1997
• Edition: 6
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To reduce the number of standard samples to be measured so as to provide a calibration curve that has high accuracy for all concentration ranges by dividing the calibration curve into three parts, i.e., low-, medium-, and high-concentration ranges, and calculating a regression function for the concentration ranges with a boundary condition such that gradients at their boundary points are equal. SOLUTION: When analytical measured values of standard samples are input from an input means 12, a computing means 16 receives the measured values and computes a calibration curve regression function based on a program stored in a ROM 18. A calibration curve origination means 20 originates a calibration curve based on the regression curve calculated by the means 16. The calibration curve is stored in a RAM 22. After formation of the calibration curve, when analytical measured values of the samples for analysis are input from the means 12, an output means 14 calculates and outputs the concentration of a material for inspection in the sample by checking the analytical measured value of the sample against the calibration curve stored in the RAM 22.