SEMICONDUCTOR DEVICE

PROBLEM TO BE SOLVED: To provide a semiconductor device with reliability for a long time, by reducing shearing distortion caused at an end part of resin formed around a semiconductor element. SOLUTION: A semiconductor device 10 includes a circuit wiring board 2 and a semiconductor element 1 mounted...

Full description

Saved in:
Bibliographic Details
Main Authors TATEYAMA KAZUKI, SAITO MASAYUKI, YAMADA HIROSHI, HONMA SOICHI, TOGASAKI TAKASHI
Format Patent
LanguageEnglish
Published 30.06.1997
Edition6
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:PROBLEM TO BE SOLVED: To provide a semiconductor device with reliability for a long time, by reducing shearing distortion caused at an end part of resin formed around a semiconductor element. SOLUTION: A semiconductor device 10 includes a circuit wiring board 2 and a semiconductor element 1 mounted on the board 2 with a bump electrode 3. A space between the board 2 and the semiconductor element 1 and a space around the semiconductor element 1 are sealed with a resin containing inorganic filler. The resin part includes a first resin 6 in a space surrounded with most outer bumps 3 in a circumferential part of the semiconductor element 1 and a second resin 7 in a space not surrounded with the most outer bumps 3. In addition, at least one index out of a containing ratio of inorganic filler, a maximum size of grain or a mean size of grain of the first resin 6 is made larger than that of the second resin 7.
Bibliography:Application Number: JP19950333323