TEST DESIGN METHOD AND DEVICE, TEST METHOD AND DEVICE

PROBLEM TO BE SOLVED: To obtain a test device capable of determining a test specification for judging good or bad of a product as a state reducing test design manday by producing each design specification and reflecting the test condition controlled by a test system to the test condition memorized i...

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Bibliographic Details
Main Authors TOBA TADANOBU, NAKAHARA KINICHI, KIKUCHI SHUJI, FUKIAGE HIROSHI, MIYAZUMI MASAKI
Format Patent
LanguageEnglish
Published 30.06.1997
Edition6
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:PROBLEM TO BE SOLVED: To obtain a test device capable of determining a test specification for judging good or bad of a product as a state reducing test design manday by producing each design specification and reflecting the test condition controlled by a test system to the test condition memorized in advance. SOLUTION: Included as elements are a test board input processing part 1, a test board figure producing part 2, a test program producing part 3, a test specification producing part 4, a test content template memory part 5, a test condition data memory part 6, a test hard model data memory part 7, a test method memory part 8, a grammar model memory part 9, an actual machine control data extraction part 10, an actual machine control data register processor part 11. By this, a test designer only needs to determine the condition considering the function of part of products, setting of test conditions considering an LSI tester becomes unnecessary, a test program, a test board and a test specification are automatically produced and design manday can be reduced.
Bibliography:Application Number: JP19950332289