PROJECTION X-RAY ALIGNER
PROBLEM TO BE SOLVED: To provide a projection X-ray aligner in which aberration is measured and reduced or eliminated to prevent resolution from lowering without a decrease in throughput. SOLUTION: An aberration measuring mechanism 5 is fixed to a wafer stage 12 and is movable with it. To measure ab...
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Main Author | |
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Format | Patent |
Language | English |
Published |
10.06.1997
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Edition | 6 |
Subjects | |
Online Access | Get full text |
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Summary: | PROBLEM TO BE SOLVED: To provide a projection X-ray aligner in which aberration is measured and reduced or eliminated to prevent resolution from lowering without a decrease in throughput. SOLUTION: An aberration measuring mechanism 5 is fixed to a wafer stage 12 and is movable with it. To measure aberration, the wafer stage 12 is slid outside the imaging position of a projection optical imaging system 2, while the aberration measuring mechanism 5 is brought near the imaging position. To measure aberration, an X-ray beam 9' passing through the projection optical imaging system 2 is introduced to the aberration measuring mechanism 5. If an aberration greater than allowable is detected by the aberration measuring mechanism 5, it is reduced or eliminated by an aberration corrective mechanism, which is an optical adjustment mechanism 6 for adjusting the shapes and positions of optical elements of the projection optical system 2. |
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Bibliography: | Application Number: JP19950312277 |