SEMICONDUCTOR DEVICE

PURPOSE:To improve efficiency of failure analysis of a semiconductor device wherein many outer leads are arranged along one side of a sealed body. CONSTITUTION:In a semiconductor device wherein many outer leads 3 are arranged along one side of a sealed body 1, scales for counting the number of outer...

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Bibliographic Details
Main Authors YOSHIDA NOBUO, TOMITA YOSHINORI
Format Patent
LanguageEnglish
Published 02.02.1996
Edition6
Subjects
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Summary:PURPOSE:To improve efficiency of failure analysis of a semiconductor device wherein many outer leads are arranged along one side of a sealed body. CONSTITUTION:In a semiconductor device wherein many outer leads 3 are arranged along one side of a sealed body 1, scales for counting the number of outer leads 3 are constituted for every specified number of leads. The scales consist of colored outer leads 3A, outer leads formed wider than other outer leads 3, and marks formed on a single surface of the sealed body 1.
Bibliography:Application Number: JP19940167791