APPARATUS FOR MEASURING DETERIORATION OF MATERIAL

PURPOSE:To provide a measuring apparatus for deterioration of a material which can non-destructively quantitatively evaluating the deterioration in a material surface layer by using ultrasonic wave. CONSTITUTION:The apparatus for measuring deterioration of a material comprises an ultrasonic oscillat...

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Bibliographic Details
Main Authors FUKUHARA MIKIO, KUWANO YOSHIYUKI
Format Patent
LanguageEnglish
Published 02.02.1996
Edition6
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:PURPOSE:To provide a measuring apparatus for deterioration of a material which can non-destructively quantitatively evaluating the deterioration in a material surface layer by using ultrasonic wave. CONSTITUTION:The apparatus for measuring deterioration of a material comprises an ultrasonic oscillator 1 and a receiver 2 disposed in space at a material 3 to be measured. The oscillator 1 and the receiver 2 are connected with ultrasonic oscillating vibrator 6 via cables 4, 5. The vibrator 6 oscillates and receives the ultrasonic wave from the shearing horizontal wave (SH wave) of a transverse wave, and is connected to a computer 7 for analyzing the attenuation coefficient of the received wave. The wave of the shearing horizontal wave (SH wave) of the transverse wave has a frequency range of 0.5-100MHz and preferably 0.5-50MHz. Probes provided at the oscillator 1 and the receiver 2 preferably regulate its oscillating angle and a receiving angle corresponding to the type of the material 3 to be measured.
Bibliography:Application Number: JP19950113718