X-RAY DETECTION APPARATUS

• Main Authors: TSUCHIDA KAZUTERU, SHIMIZU HITOSHI
• Format: Patent
• Language: English
• Published: 17.09.1996
• Edition: 6
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASUREMENT OF NUCLEAR OR X-RADIATION; MEASURING; PHYSICS; TESTING

PURPOSE: To provide an X-ray detection apparatus by which the spatial distribution of X-ray energy can be measured in real time. CONSTITUTION: An X-ray detection apparatus is constituted of an X-ray detection part 1 which detects the spatial distribution of X-rays, of an absorption film 2 whose transmittance depends on X-ray energy in order to adjust the energy distribution of the X-rays to be detected, of a signal processing part 3 which processes a signal detected by the X-ray detection part 1, of a control part 4 which controls the absorption film 2 and the signal processing part 3 and of a monitor 5 which outputs the signal processed by the signal processing part 3. In the signal processing part 3, the difference between the spatial distribution of the intensity of X-rays in a present absorption film and the spatial distribution of the intensity of X-rays in an immediately preceding absorption film is found by means of a control signal 11 from the control part 4. An output result from the signal processing part 3 is observed by the monitor 5, and the spatial distribution of the X-ray energy corresponding to the difference in a transmittance between the two absorption films is measured.