TESTING SOCKET DEVICE

PURPOSE: To provide a testing socket device usable for knocking and aging tests in common without causing damages to a heater at the time of the knocking test of a cathode-ray tube. CONSTITUTION: One of the heater electrodes of a testing socket 9 usable for knocking and aging tests in common, is con...

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Bibliographic Details
Main Author YONEMURA KEITARO
Format Patent
LanguageEnglish
Published 03.09.1996
Edition6
Subjects
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Summary:PURPOSE: To provide a testing socket device usable for knocking and aging tests in common without causing damages to a heater at the time of the knocking test of a cathode-ray tube. CONSTITUTION: One of the heater electrodes of a testing socket 9 usable for knocking and aging tests in common, is connected at least to RGB cathode electrodes via shortcircuit wires 14, thereby reducing the distributed capacity of wires 10 and eliminating damages to an cathode-ray tube.
Bibliography:Application Number: JP19950032545