METHOD AND SYSTEM FOR MEASURING VERTICALITY OF STRUCTURE

PURPOSE: To realize a highly accurate measurement not susceptible to weather without requiring any obstacle-free space in the vertical direction by obtaining the actually measured value of a reference position from GPS radio waves received at a reference position on the uppermost layer of a structur...

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Bibliographic Details
Main Author KURODAI MASAHIRO
Format Patent
LanguageEnglish
Published 07.06.1996
Edition6
Subjects
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Summary:PURPOSE: To realize a highly accurate measurement not susceptible to weather without requiring any obstacle-free space in the vertical direction by obtaining the actually measured value of a reference position from GPS radio waves received at a reference position on the uppermost layer of a structure under construction and at a plurality of predetermined positions around the structure on the ground. CONSTITUTION: At first, point O is set at an appropriate position of a high rise building 20 on the ground surface and points A, B are set appropriate positions around the building on the ground surface. Correct position of each point is surveyed and the mutual positional relationship is previously determined. A reference position O' is then set, with reference to a design drawing, on the uppermost layer of the building 20 vertically to the point O. GPS receivers 1, 2, 3 installed at the points A, B and C are then controlled so that an analyzer computer 5 receives GPS radio waves simultaneously. Based on the previously inputted coordinate values at the points A, B and O, the computer 5 analyzes the GPS radio waves to determine the coordinate values at the position O'. The coordinate values are transferred to a verticality control computer 6 where the shift of the position O' from the point O is determined and displayed.
Bibliography:Application Number: JP19940289328