INSPECTING JIG FOR IN-CIRCUIT TESTER

• Main Authors: MURATA SHINYA, ONISHI KAZUYOSHI
• Format: Patent
• Language: English
• Published: 06.06.1995
• Edition: 6
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

PURPOSE:To secure contact pins for inspection in contact state with high accuracy without receiving any influence from a damper pressure by fitting a mobile base board on which the contact pins for inspection, etc., are mounted at the inside of a fixing frame with a buffer space in between. CONSTITUTION:A mobile base board 6 is mounted between an upper stopper 7 and lower stopper 8 in a fixing frame 5 and forcible pushed upward by a spring 18. Therefore, a buffer space 17 is provided between the frame 5 and board 6. After completing preparatory work for tests, an upper-surface unit 2 is turned toward a lower-surface unit 1. As a result, a positioning post 4 is aligned with a positioning hole and contact pins 9 are positioned above contact points. In addition, the board 6 is lowered by vacuum suction from the unit 1 side and the pins 9 are brought into contact with the contract points on a mounting board 12 supported by the unit 1. Under such a condition, tests are performed. Because of the buffer space 17, the board 6 is not affected by a damper pressure received by the fixing frame 5.