LSI TEST BOARD

PURPOSE:To apply a LSI test board to multiple kinds of test devices as a multi- purpose instrument by providing an additional test circuit changing form of an input signal to output it between a prescribed third terminal and a prescribed fourth terminal on a second substrate. CONSTITUTION:The test b...

Full description

Saved in:
Bibliographic Details
Main Authors NAKAMURA KOJI, NAKAHARA KINICHI, HIRAISHI AKIHIKO, HIROSE SHIGEMI, MIYAZUMI MASAKI, TAKEUCHI SHIGERU
Format Patent
LanguageEnglish
Published 19.05.1995
Edition6
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Summary:PURPOSE:To apply a LSI test board to multiple kinds of test devices as a multi- purpose instrument by providing an additional test circuit changing form of an input signal to output it between a prescribed third terminal and a prescribed fourth terminal on a second substrate. CONSTITUTION:The test board is so constituted that a first substrate 1 such as a test fixture board, second substrate 2 such as a measurement circuit board and a third substrate such as a socket-exchange board are vertically piled up in three steps. The second substrate is equipped with an additional test circuit that is provided between a prescribed third terminal 20 and a prescribed fourth terminal 21 and changes form of an input signal to output therefrom. The vertical three-step structure allows the device to be applied to any kinds of devices to be tested having different arrangement of pins or different number of pins by only changing a connection condition between a fifth terminal 30 of the third substrate 3 and an LSI socket 31. Thereby, it is possible to utilize additional test circuit for multiple kinds of test device.
Bibliography:Application Number: JP19930294301