ULTRASONIC FLAW DETECTION DEVICE AND INSPECTION METHOD

• Main Authors: TAKAHASHI HIDEO, YABUSHITA HIDEKI, ETO YOSHIMARU, SATO TOMINARI
• Format: Patent
• Language: English
• Published: 17.01.1995
• Edition: 6
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PURPOSE:To pertinently perform a flaw detection and inspection work by providing an ultrasonic flaw detection device capable of coping even with the inspection of a stainless steel sheet, giving no dead band and keeping a high S/N ratio. CONSTITUTION:An ultrasonic flaw detection device is equipped with a convergence type transmitter element 12 and a convergence type receiver element 13. In addition, the device is equipped with a probe body 11 used in contact with the surface S of a plate type material 10 as a flaw detection object. Also, the transmitting direction of the element 12 and the receiving direction of the element 13 in plan view are positioned toward one point F on a vertical bisector of a sector drawn between the positions of the elements 12 and 13. The directions are set so as to have the same inclination angle relative to the surface S of the material 10 in elevation. Furthermore, the outgoing position 21 of an ultrasonic wave from the inside of the material 10 through the element 13 comes to a position where the ultrasonic wave incident on the sample at the preset refractive angle is totally reflected on both of the internal and external surface of the material 10, and propagates to reach the external surface.