EXAMINATION METHOD AND ITS DEVICE

PURPOSE:To provide a noncontact method of testing inner leads formed on a tape carrier. CONSTITUTION:An examination part 5 of an examination device 1 which tests leads 3 formed on a tape carrier 2 is provided with a heating means 6 which applies thermal energy to an outer lead part 3b of the lead 3...

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Bibliographic Details
Main Authors YAMAZAKI KAZUO, KANEMITSU NOBUYA
Format Patent
LanguageEnglish
Published 25.03.1994
Edition5
Subjects
BASIC ELECTRIC ELEMENTS
COLORIMETRY
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
RADIATION PYROMETRY
SEMICONDUCTOR DEVICES
TESTING
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Summary:PURPOSE:To provide a noncontact method of testing inner leads formed on a tape carrier. CONSTITUTION:An examination part 5 of an examination device 1 which tests leads 3 formed on a tape carrier 2 is provided with a heating means 6 which applies thermal energy to an outer lead part 3b of the lead 3 of the tape carrier 2, an infrared ray detecting device 8 which detects the infrared ray emitted, due to supply of thermal energy, from an inner lead part 3a of the lead 3 and a calculating device 10 which decides the correctness of the lead 3, based on the information detected by the infrared ray detecting device 8.
Bibliography:Application Number: JP19920234532