DEVICE FOR GENERATING ION PLASMA EXCITED BY ELECTRON BEAM

PURPOSE:To adjust the plasma distribution in the ion forming region of the device for generating the ion plasma excited by electron beams so as to uniformalize the distribution over a wide area. CONSTITUTION:The plasma 19' in the ion forming region 10 is adjusted to the uniformly distributed st...

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Main Authors HARA TAMIO, HAMAGAKI MANABU, YAMADA TAKESHI, HIROSHIMA YASUSHI, RIYUUJI MAKOTO, TOKAI MASAKUNI
Format Patent
LanguageEnglish
Published 04.10.1994
Edition5
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Summary:PURPOSE:To adjust the plasma distribution in the ion forming region of the device for generating the ion plasma excited by electron beams so as to uniformalize the distribution over a wide area. CONSTITUTION:The plasma 19' in the ion forming region 10 is adjusted to the uniformly distributed state over the large area in the transverse direction and also to the distributed density as uniform as possible in, the longitudinal direction, thereby, the adequate construction and arrangement of multipole magnets 16', 16'' are enabled, magnetic fields are thus put into an optimum forming state so that the back multipoles 20' are omitted, and a reverse magnetic field coil 17' is made freely movable in the longitudinal direction, and in addition, the incidence of the electron beams are made plural by disposing electron beam sources in plural positions. The high-density plasma is formed uniformly in the large area in the ion forming region 10 more efficiently than heretofore. Fine dry etching as designed is executed at a high speed with high accuracy in the state of maintaining a high selection ratio of a target sample 14 to a mask material and a substrate material to be etched.
Bibliography:Application Number: JP19930091851