INSPECTION APPARATUS FOR IMAGE

• Main Authors: ASAI TAKAHIRO, OMURA KATSUYUKI
• Format: Patent
• Language: English
• Published: 19.08.1994
• Edition: 5
• Subjects: CALCULATING; COMPUTING; COUNTING; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PURPOSE:To obtain an inspection apparatus of an image which facilitates selection of the number of pixels and the resolution of the image of an inspection surface of a substance to be inspected. CONSTITUTION:This inspection apparatus of an image has an image pickup device 5 picking up the image of an inspection surface of a substance to be inspected, an image data input part 6 converting image data on the picked-up image of the substance into digital image data sequentially, an image data storage part 7 storing the image data outputted from the image data input part 6, and an image processing part 8 extracting a defective part of the substance on the basis of the image data outputted from the image data input part 6. Moreover, the apparatus is formed of an arithmetic processing part 9 which determines the quality of the substance on the basis of the feature amounts of the extracted defective part and the image data around it, a bus 10 exclusive for the image data which connects the image data input part 6, the image data storage part 7 and the image processing part 8 together and through which the image data are outputted from the image data input part 6 synchronously with an image clock and a data bus 11 which connects the image data input part 6, the image data storage part 7 and the image processing part 8 to the arithmetic processing part 9.