TEST CIRCUIT INCORPORATING SEMICONDUCTOR INTEGRATED CIRCUIT

PURPOSE:To simply measure the highest operating frequency of a high- performance, high-speed semiconductor integrated circuit with a built-in test circuit without using a high-performance, high-speed LSI tester. CONSTITUTION:A circuit outputting the data propagation state of latch circuits 30, 31, 3...

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Bibliographic Details
Main Authors ARAI SEIJI, TAKESHITA YUICHI
Format Patent
LanguageEnglish
Published 22.07.1994
Edition5
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:PURPOSE:To simply measure the highest operating frequency of a high- performance, high-speed semiconductor integrated circuit with a built-in test circuit without using a high-performance, high-speed LSI tester. CONSTITUTION:A circuit outputting the data propagation state of latch circuits 30, 31, 32,..., 3n connected in series in a clock cycle to the outside is added, the switching speeds of transistors constituting a semiconductor integrated circuit are measured, and the highest operating frequency of the semiconductor integrated circuit is indirectly measured as a result. The highest operating frequency of the high-performance, high-speed semiconductor integrated circuit can be measured without using a high-performance, high-speed LSI tester, the facility investment of a semiconductor manufacturer can be reduced, and inexpensive, high-performance semiconductor integrated circuits can be provided to users.
Bibliography:Application Number: JP19930000923