METHOD FOR EVALUATING SEMICONDUCTOR DEVICE

PURPOSE:To accurately evaluate the high-frequency characteristic of a semiconductor device by measuring the changes in current/voltage characteristics of the device before and after a reverse voltage is applied to the gate of the device. CONSTITUTION:The gate voltage (pinch-off voltage VP1) when, fo...

Full description

Saved in:
Bibliographic Details
Main Author KAMEYAMA TAKEHIKO
Format Patent
LanguageEnglish
Published 07.06.1994
Edition5
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
Online AccessGet full text

Cover

Be the first to leave a comment!
You must be logged in first