SEMICONDUCTOR INTEGRATED CIRCUIT

PURPOSE:To provide a semiconductor integrated circuit functions thereof can be checked up with reduced number of patterns in function test. CONSTITUTION:The semiconductor integrated circuit is provided with gate circuits A14, h19 which pass outputs from EXCLUSIVE-NOR gates A9-A12 only when a specifi...

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Bibliographic Details
Main Author KUBOTA HIROMICHI
Format Patent
LanguageEnglish
Published 13.05.1994
Edition5
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:PURPOSE:To provide a semiconductor integrated circuit functions thereof can be checked up with reduced number of patterns in function test. CONSTITUTION:The semiconductor integrated circuit is provided with gate circuits A14, h19 which pass outputs from EXCLUSIVE-NOR gates A9-A12 only when a specific test value is inputted, and multiplexers A5-A8 receiving 4 bits outputs from a flip-flop A4 and the gate circuit A19 and holding the input data when the gate circuit outputs '0' whereas outputs the input data when the gate circuit outputs '1'.
Bibliography:Application Number: JP19920282632