METHOD FOR DIAGNOSING REMAINING LIFE OF HIGH-TEMPERATURE EQUIPMENT

PURPOSE:To calculate the remaining life of a high-temperature equipment analytically, after making the current damage status of an existing high-temperature equipment to correspond to the damage variable of damage dynamics, by executing calculation with an obtained value as an initial value until th...

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Bibliographic Details
Main Author KITADE MASAJI
Format Patent
LanguageEnglish
Published 06.05.1994
Edition5
Subjects
MEASURING
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Summary:PURPOSE:To calculate the remaining life of a high-temperature equipment analytically, after making the current damage status of an existing high-temperature equipment to correspond to the damage variable of damage dynamics, by executing calculation with an obtained value as an initial value until the damage reaches a limit value. CONSTITUTION:A surface replica is sampled from a target site of an already installed high-temperature equipment to determine the current amount of damage. Then, the actual damage (void density + amount of deformation of crystalline particle) obtained by non-destruction inspection is made to correspond to the damage variable defined by damage dynamics to obtain the damage variable at the time of non-destructive inspection. With the damage variable as the initial value of damage and future operating conditions as input data, creep damage analysis is performed by the finite-element analysis program incorporating the damage dynamics.
Bibliography:Application Number: JP19920298002