SEMICONDUCTOR TESTING DEVICE AND ITS TESTING METHOD

• Main Authors: HASHIMOTO OSAMU, HASE KENICHI
• Format: Patent
• Language: English
• Published: 23.02.1993
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

PURPOSE:To eliminate a need for going through a portion where a register is set and enable programming to be made easily by searching for a setting value from previous test items and setting it to a register of target test items when the setting value of the register which is used for the test items...