SEMICONDUCTOR TESTING DEVICE AND ITS TESTING METHOD

• Main Authors: HASHIMOTO OSAMU, HASE KENICHI
• Format: Patent
• Language: English
• Published: 23.02.1993
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

PURPOSE:To eliminate a need for going through a portion where a register is set and enable programming to be made easily by searching for a setting value from previous test items and setting it to a register of target test items when the setting value of the register which is used for the test items is omitted. CONSTITUTION:For testing a semiconductor device, jumping to a specific test item is made and it is judged whether all settings of setting values of a register are made or not. When the setting value of the register is omitted, returning to a register of previous test items is made, it is judged whether setting of the register of previous test items is made or not, the register is set when a setting portion of the register is found, and then a specific test item is executed. When the register is not set, returning to the previous test items is made again and then the setting value is searched for. In this manner, the setting value of the omitted register is automatically searched for, thus enabling programming to be made easily.