METHOD FOR INSPECTING PANEL FORMING PROCESS OF DRAWING DIE

• Main Author: TAKANO YOSHIYUKI
• Format: Patent
• Language: English
• Published: 07.05.1993
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVINGMATERIAL; PERFORMING OPERATIONS; PHYSICS; PUNCHING METAL; TESTING; TRANSPORTING; WORKING OR PROCESSING OF SHEET METAL OR METAL TUBES, RODS ORPROFILES WITHOUT ESSENTIALLY REMOVING MATERIAL

PURPOSE:To efficiently carry out an inspection with a little man-hour in a short time, sufficiently improve the precision of data and easily manufacture of modify the die which can form the panel of high quality based on the inspected result by obtaining the three-dimensional coordinate data of the...