MATERIAL TESTING MACHINE WITH LEARNING FUNCTION

PURPOSE:To automatically set various test conditions without using one's head, and thereby simplify operations required by setting set signals based on correction data corresponding to both data for specimens set previously and test requirements concerned. CONSTITUTION:Set signals are so correc...

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Bibliographic Details
Main Author MASUSE HIDEO
Format Patent
LanguageEnglish
Published 26.10.1992
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:PURPOSE:To automatically set various test conditions without using one's head, and thereby simplify operations required by setting set signals based on correction data corresponding to both data for specimens set previously and test requirements concerned. CONSTITUTION:Set signals are so corrected by a set signal correction means 101 that an actual load pattern for a specimen agrees with a desired load pattern. The correction data of the correction means 101 is stored in a memory means 102 in advance while being matched with data for test conditions including data concerning specimens and load patterns. Set signals are set up by a set signal output means 20 with correction data newly computed based on data concerning the specimen and test conditions out of data stored in the memory. Load or displacement due to the deformation of the specimen caused by load is detected 12, and an actuator 11 is so driven that detected signals agree with set signals.
Bibliography:Application Number: JP19910091743