APPARATUS FOR MEASURING ELECTRICAL CHARACTERISTICS OF IC DEVICE

PURPOSE:To reduce the number of replacing parts at the time of the test and measurement of a device and to facilitate manufacturing by constituting a contact mechanism of three members, that is, an interface board, a relay means and a socket board all of which are detachable each other. CONSTITUTION...

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Bibliographic Details
Main Author OKITSU HIKARI
Format Patent
LanguageEnglish
Published 14.10.1992
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:PURPOSE:To reduce the number of replacing parts at the time of the test and measurement of a device and to facilitate manufacturing by constituting a contact mechanism of three members, that is, an interface board, a relay means and a socket board all of which are detachable each other. CONSTITUTION:A contact mechanism 10 setting the IC device connected to the test head 2a of an IC tester 2 to a contact state is constituted of a socket board 13 equipped with an IC socket 14, the interface board 11 connected to the head 2a and the relay means electrically connected between those boards 11, 13 and the relay means is constituted as an insertion system to connect the boards 11, 13. For example, the relay means is constituted of a probe block 12 equipped with a probe pin 15 equipped with a coaxial cable 15c and a ground pin 16. Since these three members are constituted so as to be respectively independently replaced, the number of replacing parts can be reduced at the time of the test and measurement of many kinds of devices and the contact mechanism is easily prepared.
Bibliography:Application Number: JP19910033321