THROUGH HOLE INSPECTING DEVICE

• Main Author: ONO KAZUHIKO
• Format: Patent
• Language: English
• Published: 26.08.1992
• Subjects: BASIC ELECTRIC ELEMENTS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS; MEASURING; PHYSICS; PRINTED CIRCUITS; SEMICONDUCTOR DEVICES; TESTING

PURPOSE:To set the resolution of a line sensor, suppress the memory capacity, and shorten the inspection time by inputting the X mask signal of an X mask signal circuit to a Y mask signal circuit, and using a signal associating both circuits as the mask signal inputted to a defect detection section. CONSTITUTION:A line sensor 4 is fixed at the position in the visual field of the inspection area of the green sheet of an inspected object fixed on a table moving system 1. An image for one line is extracted, the inspected object is moved by one line, these actions are repeated to extract the image for the whole area, and the image signal (c) is converted 8a into the binary image signal (c) by a defect inspection section 8. The X mask signal (f) is generated 6 with the origin signal (b) from an origin detector 3 serving as a starting point. A Y mask signal generating circuit 7 performs a phase shift in response to the level that the signal (f) is frequency-divided with the scanning trigger (e) serving as a starting point, and a mask pattern associates the circuits 6, 7. The comparing circuit 8c of the detection section 8 detects the defective portion of a through hole.