CHARGED-PARTICLE BEAM TREATMENT METHOD AND DEVICE THEREOF

PURPOSE:To make it possible to perform a highly reliable processing even on a complicated element and to make it possible to conduct all the processes of the processing in a short time by a method wherein a charged-particle beam treatment method is performed so as to have a process for treating the...

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Bibliographic Details
Main Authors HARAICHI SATOSHI, SHIMASE AKIRA, AZUMA JUNZO, TAKAHASHI TAKAHIKO, ITO FUMIKAZU, MORI JUNICHI
Format Patent
LanguageEnglish
Published 03.07.1992
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