IC TESTING APPARATUS

PURPOSE:To freely select cable length from a plurality of cable lengths prescribed so as to be different stepwise by altering the phase of a timing clock corresponding to the alteration of the length of a cable. CONSTITUTION:Delay elements each prescribing the phase of a the timing clock applied to...

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Bibliographic Details
Main Author IDE KEIICHIRO
Format Patent
LanguageEnglish
Published 29.06.1992
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:PURPOSE:To freely select cable length from a plurality of cable lengths prescribed so as to be different stepwise by altering the phase of a timing clock corresponding to the alteration of the length of a cable. CONSTITUTION:Delay elements each prescribing the phase of a the timing clock applied to a pattern selection part 103, a waveform shaping part 104 and a logical comparison part 105 are mounted on a common substrate 500A. Two or more kinds of the common substrates 500A are prepared corresponding to the length of the cable 300 connecting a tester main body 100 and a test head 200 and replaced corresponding to the alteration of the length of the cable 300 to make it possible to supply an accurate timing clock to the pattern selection part 103, the waveform shaping part 104 and the logical comparison part 105 regardless of the alteration of the length of the cable 300. By this constitution, the length of the cable 300 connecting the tester main body 100 and the test head 200 can be selected from two or more preliminarily prescribed lengths. As a result, the degree of freedom and operability in the arrangement of a tester can be enhanced.
Bibliography:Application Number: JP19900309954