MEASURING APPARATUS OF COAXIAL DEGREE

• Main Author: UCHIDA JUNZO
• Format: Patent
• Language: English
• Published: 17.06.1992
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

PURPOSE:To minimize a measuring range and to enable execution of highly precise measurement in a short time and with ease by moving an approaching and corresponding measuring surface of a probe until it comes into contact with the periphery of a sectional part of a substance to be measured, in such a manner as to correspond to the dimension of the diameter of the substance. CONSTITUTION:An electron gun 16, a substance to be measured, is held 17, while a probe 9 is made so movable as to come into contact with the periphery of a sectional part of the gun 16. Moreover, a displacement detector 10 outputs an electric signal showing the amount of displacement of the probe 9, and an elevator 5 moves the detector 10 up and down relatively for the gun 16 along the axial line of the sectional part and detects a position of elevation of the detector 10. A rotating mechanism 14 rotates the probe 9 on the whole while bringing it into contact with the periphery of the sectional part, with the axis of rotation thereof made to align substantially with the axial line of the sectional part. On the occasion, an approaching and corresponding measuring surface of the probe 9 is moved until it comes into contact with the internal surface of a grid of the gun 16, in such a manner as to correspond to the dimension of the inside diameter of the hole of the grid. Thereby it is made possible to minimize a measuring range of a position detector 8 and to execute highly precise and efficient measurement in a short time and with ease.