CIRCUIT BOARD TEST FIXTURE

PURPOSE:To obtain both a function test and an in-circuit test function by providing a mechanism which switches and stops the circuit board to be tested between the position where the circuit board enters into contact to only long- stroke spring probe pins and the position where the board enters into...

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Bibliographic Details
Main Author MIZUNIWA YASUHIRO
Format Patent
LanguageEnglish
Published 11.11.1991
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:PURPOSE:To obtain both a function test and an in-circuit test function by providing a mechanism which switches and stops the circuit board to be tested between the position where the circuit board enters into contact to only long- stroke spring probe pins and the position where the board enters into contact to all spring probe pins. CONSTITUTION:A base plate 2, a top plate 3, a seal 4, and the PCB 10 to be inspected form one vacuum chamber with vacuum pressure from an air suction hole 5. When the vacuum pressure exceeds the elasticity of a spring 6, the plate 3 moves down and stops at a position A and while spring probe pins 7 do not enter into contact to the PCB 10, only the long-stroke probe pins 8 enter into contact to the edge connector 11 of the PCB 10, so the function test can be conducted in the normal operation state of respective nodes of the PCB 10. When a cam 9 is rotated to further apply vacuum pressure, the plate 3 moves down to a position B and abut on the probe pins 7 and 8, thereby conducting an in-circuit test.
Bibliography:Application Number: JP19900050999