YARN IRREGULARITY INSPECTING METHOD

• Main Authors: ISHIGURO YOSHIO, KITAZUMI KAZUNORI
• Format: Patent
• Language: English
• Published: 11.10.1991
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; FLEXIBLE MATERIALS NOT OTHERWISE PROVIDED FOR; LAUNDERING; MARKING, INSPECTING, SEAMING OR SEVERING TEXTILE MATERIALS; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; SEMICONDUCTOR DEVICES; TESTING; TEXTILES; TREATMENT OF TEXTILES OR THE LIKE

PURPOSE:To detect size, such as a diameter and a width, which prescribes the thickness of yarn and its variance quantitatively by detecting an image of light which is made incident on a photodetecting means consisting of plural charge coupled elements arrayed linearly at right angles to the traveling direction of the yarn. CONSTITUTION:A photodetection part 14 is equipped with the charge coupled elements 16 arrayed linearly at right angles to the traveling direction of the raw silk 12 and a lens 18 and a light source which are arranged between the charged coupled elements 16 and raw silk 12. For inspection, the raw silk 12 is made to travel at a constant speed as shown by an arrow and cross the path of light projected by the light source, and the light is made incident on the charge coupled elements 16 of the photodetection part 14. The width of the raw silk 12 is enlarged through the lens 18 and the output signal of the photodetection part 14 is led to a processing part in order to detect the distribu tion of the size prescribing the thickness of the raw silk 12 according to the mean value and standard deviation of measured sizes. A variance distribution is obtained from this distribution and the extent of the yarn irregularity of the raw silk 12 can be displayed quantitatively.