LASER RAMAN SPECTROPHOTOMETER

PURPOSE:To obtain distortion-free spectra with always a high sensitivity by providing a polarization plane rotating element on a laser beam path. CONSTITUTION:The laser beam emitted from an argon ion laser beam source 1 is converted to a circularly polarized light by passing a circular polarization...

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Bibliographic Details
Main Authors EZAWA MASAYOSHI, EGUCHI KINYA
Format Patent
LanguageEnglish
Published 04.10.1991
Subjects
COLORIMETRY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
TESTING
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Summary:PURPOSE:To obtain distortion-free spectra with always a high sensitivity by providing a polarization plane rotating element on a laser beam path. CONSTITUTION:The laser beam emitted from an argon ion laser beam source 1 is converted to a circularly polarized light by passing a circular polarization converting element 3. A sample 5 is irradiated with this polarized laser beam. The Raman scattered light emitted by the sample 5 is reflected by two sheets of plane mirrors 13, 13' and enters a spectroscope. The incident Raman scattered light on the spectroscope 6 is spectrally divided by diffraction gratings 7, 7' and is then made incident on a detector 10 via a slit 9. For example, a quarter- wave plate is used as this circular polarization converting element 3. Since the sample is irradiated with the circularly polarized light, the Raman scattered light is polarized to the circularly polarized light as well. The degradation in the sensitivity by the dissidence of the polarization characteristics between the diffraction gratings and the Raman scattered light is, therefore, prevented.
Bibliography:Application Number: JP19900019002