MANUFACTURE OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

PURPOSE:To decrease the number of manufacturing processes in a TAB (a Tape Automated Bonding) by a method wherein marks are formed at prescribed places on a film in a process prior to a process of sealing a semiconductor chip with a potting resin. CONSTITUTION:The element formation surface and the s...

Full description

Saved in:
Bibliographic Details
Main Authors IGARASHI SHIGEKI, KAWANOBE TORU
Format Patent
LanguageEnglish
Published 02.05.1991
Subjects
Online AccessGet full text

Cover

Loading…
Abstract PURPOSE:To decrease the number of manufacturing processes in a TAB (a Tape Automated Bonding) by a method wherein marks are formed at prescribed places on a film in a process prior to a process of sealing a semiconductor chip with a potting resin. CONSTITUTION:The element formation surface and the side surfaces of a semiconductor chip 6 are sealed with a potting resin 8, such as an epoxy resin or the like, for preventing the deterioration of the electrical characteristics of the chip 6, which is caused by the intrusion of water content and the like. In a TAB 1, marks M marked a type, a production lot number and the like, for example, are formed on a film 2 at a region where lead wirings 3 are not formed. These marks M are constituted of the same material as that of the wirings 3. That is, the marks M are formed simultaneously in a process, in which a conductive foil (such as a Cu foil) laminated previously on one surface of the film 2 is etched to form the lead wirings 3. The number of manufacturing processes in the TAB can be decreased.
AbstractList PURPOSE:To decrease the number of manufacturing processes in a TAB (a Tape Automated Bonding) by a method wherein marks are formed at prescribed places on a film in a process prior to a process of sealing a semiconductor chip with a potting resin. CONSTITUTION:The element formation surface and the side surfaces of a semiconductor chip 6 are sealed with a potting resin 8, such as an epoxy resin or the like, for preventing the deterioration of the electrical characteristics of the chip 6, which is caused by the intrusion of water content and the like. In a TAB 1, marks M marked a type, a production lot number and the like, for example, are formed on a film 2 at a region where lead wirings 3 are not formed. These marks M are constituted of the same material as that of the wirings 3. That is, the marks M are formed simultaneously in a process, in which a conductive foil (such as a Cu foil) laminated previously on one surface of the film 2 is etched to form the lead wirings 3. The number of manufacturing processes in the TAB can be decreased.
Author IGARASHI SHIGEKI
KAWANOBE TORU
Author_xml – fullname: IGARASHI SHIGEKI
– fullname: KAWANOBE TORU
BookMark eNrjYmDJy89L5WQw83X0C3VzdA4JDXJV8HdTCHb19XT293MJdQ7xD1Lw9AtxdQ9yDHF1UXD2DHIO9QxRcHEN83R25WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8V4BHgbGhgZmBiaGjsbEqAEAMOAp9A
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
ExternalDocumentID JPH03106041A
GroupedDBID EVB
ID FETCH-epo_espacenet_JPH03106041A3
IEDL.DBID EVB
IngestDate Fri Jul 19 11:59:54 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_JPH03106041A3
Notes Application Number: JP19890245833
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19910502&DB=EPODOC&CC=JP&NR=H03106041A
ParticipantIDs epo_espacenet_JPH03106041A
PublicationCentury 1900
PublicationDate 19910502
PublicationDateYYYYMMDD 1991-05-02
PublicationDate_xml – month: 05
  year: 1991
  text: 19910502
  day: 02
PublicationDecade 1990
PublicationYear 1991
RelatedCompanies HITACHI TOKYO ELECTRON CO LTD
HITACHI LTD
RelatedCompanies_xml – name: HITACHI LTD
– name: HITACHI TOKYO ELECTRON CO LTD
Score 2.4048154
Snippet PURPOSE:To decrease the number of manufacturing processes in a TAB (a Tape Automated Bonding) by a method wherein marks are formed at prescribed places on a...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
PRINTED CIRCUITS
SEMICONDUCTOR DEVICES
Title MANUFACTURE OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19910502&DB=EPODOC&locale=&CC=JP&NR=H03106041A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LS8NAEB5qFfWmVan1wQqSWzC1bZocgqS7iUmhSYhJ6a100w3oIS024t93NqbWi96WXRhmB-bB7DffAtznGAHzRVeoXS67VZhh1YXODVUYEv0nuG4K2e-YBLqX9sezwawBb9tZmIon9LMiR0SPytDfyyper3dNLFZhKzcP_BW3Vk9uYjFlWY-LYbWgPSpsZDlRyEKqUGqNIyWILU9SYOpav2vvwT6W0UMJ_3KmIzmVsv6dUtwTOIhQWlGeQkMULTii25_XWnA4qR-8cVn73uYM9IkdpK5NJU6BhC55kRYMA5bSJIyJpLZ9jm2MQ4T6MU39hDBn6lPnHO5cJ6GeigrMf247H0c7XXsX0CxWhWgDWZqSaw3LEa4t-3lumHo24END6xkLjWcZv4TO33I6_x1ewfE3_kmOal9Ds3z_EDeYaUt-W5noC64bfQM
link.rule.ids 230,309,783,888,25578,76884
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LT4NAEJ7Uaqw3rRqtL0wMNyJ9IT0QQxcQsDyC0PTWdGFJ9EAbi_HvO4vUetHbZjeZzE4yj8x-8y3AXY4RMF90mdSlvFuFGVZaKFSVmMrRf4wqI8b7HZ6v2MnAnQ1nDXjbzMJUPKGfFTkielSK_l5W8Xq1bWIZFbZyfU9fcWv5aMWaIWb1uBhWC3JPNMaaGQZGQERCNDcU_UizOQWmIg-6-g7sYomtcp59czrmUymr3ynFOoS9EKUV5RE0WNGGFtn8vNaGfa9-8MZl7XvrY1A83U8snXCcghBYwgu3YOAbCYmDSODUtk-RjnFIIE5EEicWDHPqEPMEbi0zJraECsx_bjt3w62u_VNoFsuCnYGQjTjXGpYjVM4Gea6OlHRIH1S5ry5kmqb0HDp_y-n8d3gDLTv2JvOJ4z9fwME3FoqPbV9Cs3z_YFeYdUt6XZnrC7I9f_M
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=MANUFACTURE+OF+SEMICONDUCTOR+INTEGRATED+CIRCUIT+DEVICE&rft.inventor=IGARASHI+SHIGEKI&rft.inventor=KAWANOBE+TORU&rft.date=1991-05-02&rft.externalDBID=A&rft.externalDocID=JPH03106041A