METHOD AND APPARATUS FOR DETECTING POSITION
PURPOSE:To enable the determining of a position of a part to be detected as a whole at a high accuracy by a method wherein a part to be detected is irradiated with a slit light to take an image thereof in a clear light contrast from other parts to determine an interface point between the at to be de...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
09.08.1990
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Subjects | |
Online Access | Get full text |
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Summary: | PURPOSE:To enable the determining of a position of a part to be detected as a whole at a high accuracy by a method wherein a part to be detected is irradiated with a slit light to take an image thereof in a clear light contrast from other parts to determine an interface point between the at to be detected and the other parts at points and the interface point is used to obtain a position of the part to be detected. CONSTITUTION:A part M to be detected is irradiated with a slit light 6 at points thereof over the part to be detected and other parts and an image of the part M to be detected irradiated with the slit light 6 is taken by a camera means 3. Therefore, the part M to be detected is lighted by a bright slit light 6 at points thereof, which allows the taking of the image clearly at these points. By processing an image signal thus obtained by an image processing means 14, an interface point can be determined accurately between the part M to be detected and other parts at points thereof. The interface point is used to determine a position of the part M to be detected thereby enabling the determining of a position of the part M to be detected as a whole at high accuracy. |
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Bibliography: | Application Number: JP19890023186 |