EDDY CURRENT TEST PROBE

PURPOSE:To enable detection of both of a minute flaw and a flaw in the longitudinal direction by disposing a plurality of coils on the circumference of one probe and by disposing the coils on a soft material. CONSTITUTION:Coils 7 to 10 are not divided to be equal completely on the circumference, but...

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Bibliographic Details
Main Author SATO KINYA
Format Patent
LanguageEnglish
Published 18.05.1990
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:PURPOSE:To enable detection of both of a minute flaw and a flaw in the longitudinal direction by disposing a plurality of coils on the circumference of one probe and by disposing the coils on a soft material. CONSTITUTION:Coils 7 to 10 are not divided to be equal completely on the circumference, but are so sized that the end parts thereof overlap a little each other when they are disposed on the circumference of one probe 1. Besides, the coils 7 to 10 are so fitted as to cover the outer periphery of a soft material 11, such as urethane, having elasticity. Signals from the coils 7 to 10 at the time of flaw detection are so processed that the signals from the coils 7 and 8, and 9 and 10, facing each other respectively are processed as coupled. The signal detected from the coil 7 and that detected from the coil 8 are so processed that the difference between them is detected. According to this constitution, a minute flaw and a flaw in the longitudinal direction can be detected simultaneously and stably by one probe.
Bibliography:Application Number: JP19880283649