RETARDATION MEASURING APPARATUS

PURPOSE:To measure the retardation of an object to be measured having a light impervious film provided to the single surface thereof, by providing a polarizer and a 1/4 wavelength plate to a reciprocating optical system formed by the reflection of the light emitting from a measuring light source by...

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Bibliographic Details
Main Authors YOSHII MASAKI, KANEDA AIZO, EBINUMA NAOTAKE
Format Patent
LanguageEnglish
Published 12.06.1989
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
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Summary:PURPOSE:To measure the retardation of an object to be measured having a light impervious film provided to the single surface thereof, by providing a polarizer and a 1/4 wavelength plate to a reciprocating optical system formed by the reflection of the light emitting from a measuring light source by the film formed to the object to be measured. CONSTITUTION:The beam 16 emitted from laser 2 reciprocates in an object 5 to be measured by a polarizer 3, a 1/4 wavelength plate 4 and the reflecting film 5b on the object 5 to be measured to return to a light detector 8 through the wavelength plate 4 and the polarizer 3. The intensity of the returned light 16' is inputted too a CPU 17 through an A/D converter 10'. In the measurement of luminous intensity, the wavelength plate 4 is rotationally adjusted by a pulse motor 9 controlled by the CPU 17 so that the intensity of the return beam 16' becomes max. The beam intensity at that time is stored and the rotary position of the wavelength plate 4 is stored and, further, the wavelength plate is rotated by 45 deg. and the intensity of the return beam at that time is stored. By this operation, the retardation of the reciprocating path of the object 5 to be measured can be calculated.
Bibliography:Application Number: JP19870307512