REDUCTION STEPPER
PURPOSE:To achieve a highly accurate superposition by detecting a number of position detecting patterns within a wafer, by performing distribution processing to check whether the obtained detection data are correct or not, and by extracting only the correct detected data. CONSTITUTION:A pattern on a...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
26.05.1989
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Subjects | |
Online Access | Get full text |
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