ACTIVE MATRIX TYPE LIQUID CRYSTAL DISPLAY DEVICE

• Main Authors: OKI KENICHI, YANAI KENICHI, ENDO TETSURO, KAMATA TAKESHI
• Format: Patent
• Language: English
• Published: 26.04.1989
• Subjects: ADVERTISING; BASIC ELECTRIC ELEMENTS; CRYPTOGRAPHY; DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING; DISPLAY; DISPLAYING; EDUCATION; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; FREQUENCY-CHANGING; LABELS OR NAME-PLATES; NON-LINEAR OPTICS; OPTICAL ANALOGUE/DIGITAL CONVERTERS; OPTICAL LOGIC ELEMENTS; OPTICS; PHYSICS; SEALS; SEMICONDUCTOR DEVICES; SIGNS; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF

PURPOSE:To decide which thin film transistor TFT is short-circuited, by connecting drain electrodes of two TFTs connected to the same liquid crystal cell to the next scan bus line and the next but one scan bus line respectively. CONSTITUTION:A drain electrode D of one TFT 1 of two TFTs 1 and 1' connected to the same liquid crystal cell LC is led out to the next scan bus line SBn+1, and a drain electrode D' of the other TFT 1' is led to the next but one scan bus line SBn+2. If one TFT connected to a line SBn is short-circuited, the short-circuit test is performed between lines SBn and SBn+1 and between lines SBn and SBn+2. The occurrence of short-circuit of the TFT 1 is detected when short-circuit is detected between lines SBn and SBn+1, and that of the TFT 2 is known when short-circuit is detected between lines SBn and SBn+2.