JP2758209B

• Main Author: INOE KAZUHIKO
• Format: Patent
• Language: English
• Published: 28.05.1998
• Edition: 6
• Subjects: ELECTRICITY

PURPOSE:To improve a Hall element of this design in test yield after assembling by a method wherein at least either a pair of input electrodes or a pair of output electrodes is made different from each other in shape. CONSTITUTION:A Hall element chip 20 is fixed to a chip mounting bed 21 of a lead frame. A pair of input electrodes 13 and 5 in contact with an operating region 2 is formed different from each other in shape. The corner of the electrode 13 opposite to the part in contact with the operating region 2 is tapered 18 to make the electrode 13 distinct from the electrode 5. That is, the tapered part 18 is provided on the outer corner of the input electrode 13, which part has no effect on the operation of the element. If the chip 20 is rotated by an angle of 180 degrees, which fact can be easily found as the electrodes in a distinct contrast to each other in shape are changed in arrangement. Therefore, even if a chip is apt to change in characteristics due to the orientation of electrodes, a defective chip caused by the mis-orientation of the electrodes hardly occur in a product check after assembly, so that a Hall element of this design can be kept high in yield.