JP2531596B

• Main Authors: OKADA KATSUYUKI, TSUJIUCHI JUNPEI
• Format: Patent
• Language: English
• Published: 04.09.1996
• Edition: 6
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

PURPOSE:To have the whole reproduced surface image which is ultimately close to the real one throughout the measuring surface by tying reproduced surfaces, obtained through calculation for each division, continuously with one another on the basis of the measuring data on different divisions. CONSTITUTION:The applicable surface is measured so that the K'th division SK and adjoining (K+1)'th division SK+1 are overlapping by an amount W, and on the basis of the data thus obtained, the specific shape of the measuring surface, i.e., the functional expressions PSIK and PSIK+1 representing the reproduced surfaces, is calculated by a microprocessor. The expressions PSIK and PSIK+1 are converted into an integral coordinates system, and corresponding points after conversion of coordinates are determined through computation. The data of each reproduced surface for corresponding points in the number (n) is substituted in a specified correction formula, and simultaneous equations in the number (n) are set up. The factor of a continuous equation inherent in each division is decided by solving these simultaneous equations. On the basis of the decided continuous equation, the functional expressions representing different reproduced surfaces are corrected so that adjoining divisions continue in good workmanship.