MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE
To provide a technique of being able to manufacture a highly reliable semiconductor device using a scribe ad brake method.SOLUTION: A manufacturing method for a semiconductor device includes the steps of: pressing, on a first surface (2a) of a semiconductor substrate (2) including a plurality of ele...
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Main Authors | , |
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Format | Patent |
Language | English Japanese |
Published |
27.06.2024
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Subjects | |
Online Access | Get full text |
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Summary: | To provide a technique of being able to manufacture a highly reliable semiconductor device using a scribe ad brake method.SOLUTION: A manufacturing method for a semiconductor device includes the steps of: pressing, on a first surface (2a) of a semiconductor substrate (2) including a plurality of element regions (3), a scribing wheel (32) along a border (4) of the element regions to make the semiconductor substrate elastically deformed, thereby forming a groove (G) on the first surface, in which a crack (5) is formed along the groove extending in a thickness direction of the semiconductor substrate below the groove; grinding the first surface after the groove is formed; and dividing the semiconductor substrate along the border by, after the first surface is ground, pressing a dividing member (33) on the semiconductor substrate along the border of a second surface (2b) of the semiconductor substrate existing on a side opposite to the first surface.SELECTED DRAWING: Figure 9
【課題】スクライブアンドブレイク工法を利用して、高い信頼性を有する半導体装置を製造し得る技術を提供すること。【解決手段】半導体装置の製造方法は、複数の素子領域(3)を有する半導体基板(2)の第1表面(2a)に、前記素子領域の境界(4)に沿ってスクライビングホイール(32)を押し当てることによって、前記半導体基板を塑性変形させることにより前記第1表面に溝(G)を形成する工程であって、前記溝の下部に前記溝に沿うと共に前記半導体基板の厚み方向に延びるクラック(5)が形成される工程と、前記溝を形成する前記工程の後に、前記第1表面を研削する工程と、前記第1表面を研削する前記工程の後に、前記第1表面の反対側に位置する前記半導体基板の第2表面(2b)に前記境界に沿って前記半導体基板に分割部材(33)を押し当てることによって、前記境界に沿って前記半導体基板を分割する分割工程と、を備える。【選択図】図9 |
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Bibliography: | Application Number: JP20220201010 |