INSPECTION SUPPORT DEVICE AND INSPECTION SUPPORT METHOD

• Main Authors: AZUMA TOMOAKI, YAMASHITA KIMITAKA, YADA YOHEI, YAMADA HIROHISA, KURODA NORIYUKI, OSAWA JUNJI, HAYASE TAKUMI, YASUE TOSHIHIKO
• Format: Patent
• Language: English; Japanese
• Published: 17.06.2024
• Subjects: CALCULATING; COMPUTING; COUNTING; DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR; TESTING

To provide an inspection support device and an inspection support method that appropriately and easily perform an inspection of a building for identifying the state of a portion to be inspected on the basis of a photographed image of the portion to be inspected.SOLUTION: An inspection support device...