INSPECTION SUPPORT DEVICE AND INSPECTION SUPPORT METHOD

• Main Authors: AZUMA TOMOAKI, YAMASHITA KIMITAKA, YADA YOHEI, YAMADA HIROHISA, KURODA NORIYUKI, OSAWA JUNJI, HAYASE TAKUMI, YASUE TOSHIHIKO
• Format: Patent
• Language: English; Japanese
• Published: 17.06.2024
• Subjects: CALCULATING; COMPUTING; COUNTING; DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR; TESTING

To provide an inspection support device and an inspection support method that appropriately and easily perform an inspection of a building for identifying the state of a portion to be inspected on the basis of a photographed image of the portion to be inspected.SOLUTION: An inspection support device 10 includes a setting unit 31 for setting a portion to be inspected of a building, a presenting unit 32 for presenting support information on capturing an image of the portion to be inspected to a user on the basis of specification information on the specifications of the portion to be inspected stored in a database server 11, an acquiring unit 33 for acquiring a capturing image of the portion to be inspected, and an identification unit 36 for analyzing the capturing image and identifying the state of the portion to be inspected.SELECTED DRAWING: Figure 5 【課題】 検査対象部位の撮影画像に基づいて当該部位の状態を特定する建物の検査を、適切に且つ容易に行うための検査支援装置、及び検査支援方法を提供する。【解決手段】 検査支援装置１０が、建物の検査対象部位を設定する設定部３１と、データベースサーバ１１に記憶された検査対象部位の仕様に関する仕様情報に基づいて、検査対象部位の撮影に関する支援情報をユーザに対して提示する提示部３２と、検査対象部位の撮影画像を取得する取得部３３と、撮影画像を解析して、検査対象部位の状態を特定する特定部３６と、を備える。【選択図】 図５