SEMICONDUCTOR DEVICE
To provide a semiconductor element capable of suppressing characteristic deterioration.SOLUTION: An amplifier comprises an FET, an input matching circuit, and an output matching circuit. The FET comprises: a substrate 10; a source electrode 12; a drain electrode 16; a first gate electrode 14a; a sec...
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Main Authors | , |
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Format | Patent |
Language | English Japanese |
Published |
18.04.2024
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Subjects | |
Online Access | Get full text |
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Summary: | To provide a semiconductor element capable of suppressing characteristic deterioration.SOLUTION: An amplifier comprises an FET, an input matching circuit, and an output matching circuit. The FET comprises: a substrate 10; a source electrode 12; a drain electrode 16; a first gate electrode 14a; a second gate electrode 14b; a gate pad provided so as to sandwich the first gate electrode between the gate pad and the second gate electrode and electrically connected to the first gate electrode; a first gate line 18 provided above the source electrode and opposite to the substrate with respect to the source electrode, and extending in a first direction Y; a second gate line 19b provided above the source electrode and extending in a second direction X crossing the first direction Y, having a first end connected to the first gate line and a second end opposite the first end electrically connected to the second gate electrode outside the source electrode; and a first guard metal layer 21b provided between the second gate line and the drain electrode and at least a part thereof is provided closer to the drain electrode than the source electrode, and electrically connected to the source electrode.SELECTED DRAWING: Figure 3
【課題】特性劣化抑制可能な半導体素子を提供する。【解決手段】FET、入力整合回路及び出力整合回路を備えている増幅器において、FETは、基板10と、ソース電極12と、ドレイン電極16と、第1ゲート電極14aと、第2ゲート電極14bと、第2ゲート電極とで第1ゲート電極を挟むように設けられ、第1ゲート電極と電気的に接続されるゲートパッドと、ソース電極の基板とは反対側の上方に設けられ、第1方向に延伸する第1ゲート配線18と、ソース電極の上方に設けられ、第1方向Yに交差する第2方向Xに延伸し、第1端が第1ゲート配線と接続され、第1端とは反対の第2端がソース電極の外において第2ゲート電極と電気的に接続される第2ゲート配線19bと、第2ゲート配線とドレイン電極との間に設けられ、少なくとも一部はソース電極よりドレイン電極の方に設けられ、ソース電極と電気的に接続された第1ガード金属層21b他と、を備える。【選択図】図3 |
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Bibliography: | Application Number: JP20220162621 |