SEMICONDUCTOR LAMINATE SUBSTRATE, LIGHT EMITTING COMPONENT, LIGHT EMITTING DEVICE, MEASURING APPARATUS, AND METHOD FOR MANUFACTURING SEMICONDUCTOR LAMINATE SUBSTRATE

• Main Authors: MURATA MICHIAKI, NISHIZAKI SAORI, KONDO TAKASHI, HIGUCHI TAKAFUMI
• Format: Patent
• Language: English; Japanese
• Published: 08.04.2024
• Subjects: ANALOGOUS ARRANGEMENTS USING OTHER WAVES; BASIC ELECTRIC ELEMENTS; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; DEVICES USING STIMULATED EMISSION; ELECTRICITY; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION ORRERADIATION OF RADIO WAVES; MEASURING; PHYSICS; RADIO DIRECTION-FINDING; RADIO NAVIGATION; TESTING

To provide a semiconductor laminate substrate, etc., in which the resonance wavelength of a light emitting element is easier to ascertain than in the case where the resonance of the light emitting element and the resonance due to the influence of a thyristor have the same resonance wavelength.SOLUTION: A semiconductor laminate substrate has a substrate, and a laminated structure including a first semiconductor laminate provided on the substrate and processed into a light emitting element, and a second semiconductor laminate provided on the first semiconductor laminate and processed into at least one thyristor, in which the laminate structure is adjusted such that the two resonance wavelengths due to the influence of the thyristor are located on both sides of a resonance wavelength of the light emitting element.SELECTED DRAWING: Figure 7 【課題】発光素子の共振とサイリスタの影響による共振とが同じ共振波長を有する場合と比較して、発光素子の共振波長を把握し易くした半導体積層基板等を提供する。【解決手段】半導体積層基板は、基板と、基板の上に設けられ、発光素子に加工される第１の半導体積層体、および、第１の半導体積層体の上に設けられ、少なくとも１つのサイリスタに加工される第２の半導体積層体を含む積層構造と、を備え、サイリスタの影響による２つの共振波長が、発光素子の共振波長の両側に位置するように、積層構造の調整が行われたことを特徴とする。【選択図】図７