MEASURING DEVICE

• Main Authors: HARA ISAO, KUWANA RYO, MASUNAGA MASAHIRO, NOMOTO SHINJI
• Format: Patent
• Language: English; Japanese
• Published: 14.03.2024
• Subjects: MEASURING; MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE; PHYSICS; TESTING

To provide a measuring device capable of increasing yield while suppressing the influence of noises.SOLUTION: The measuring device includes: a sensor unit 10 that measures a predetermined physical quantity; an amplification circuit 20 for amplifying signals output from the sensor unit 10; and a linear power supply 30 for supplying the electric power to the amplification circuit 20. The amplification circuit 20 includes a first amplifier 21 that has a first transistor using a SiC semiconductor. The linear power supply 30 includes a second amplifier 31 that has a second transistor using a SiC semiconductor. The noise characteristics of the first amplifier 21 are superior to the noise characteristics of the second amplifier 31.SELECTED DRAWING: Figure 1 【課題】ノイズの影響を抑制するとともに歩留まりを高めることが可能な測定器を提供する。【解決手段】所定の物理量を測定するセンサ部１０と、センサ部１０から出力される信号を増幅する増幅回路２０と、増幅回路２０に電力を供給するリニア電源３０と、を含み、増幅回路２０は、ＳｉＣ半導体を用いた第１トランジスタを有する第１アンプ２１を備え、リニア電源３０は、ＳｉＣ半導体を用いた第２トランジスタを有する第２アンプ３１を備え、第１アンプ２１のノイズ特性は、第２アンプ３１のノイズ特性よりも優れている。【選択図】図１