RADIATION IMAGING APPARATUS, RADIATION IMAGING SYSTEM AND METHOD FOR MANUFACTURING RADIATION IMAGING APPARATUS

• Main Authors: OIKE TOMOYUKI, KOBAYASHI TAMAKI
• Format: Patent
• Language: English; Japanese
• Published: 12.03.2024
• Subjects: MEASUREMENT OF NUCLEAR OR X-RADIATION; MEASURING; PHYSICS; TESTING

To provide a technique advantageous for suppressing a reduction in image quality.SOLUTION: A radiation imaging apparatus includes a sensor substrate and a scintillator, which are coupled to each other by a coupling member. The scintillator includes: a first surface opposed to the sensor substrate through the coupling member and covered with a first protective layer; a second surface arranged on a side opposed to the first surface and covered with a second protective layer; and a third surface connecting the first surface with the second surface and covered with a third protective layer. Each of the first protective layer, the second protective layer and the third protective layer is configured of one or more layers, and the number of layers of the first protective layer is equal to or less than the number of layers of each of the second protective layer and the third protective layer.SELECTED DRAWING: Figure 1 【課題】画質の低下を抑制するのに有利な技術を提供する。【解決手段】センサ基板とシンチレータとが結合部材によって結合された放射線撮像装置であって、前記シンチレータは、前記結合部材を介して前記センサ基板に対向し、第１保護層によって覆われた第１面と、前記第１面とは反対側に配され、第２保護層によって覆われた第２面と、前記第１面と前記第２面とを接続し、第３保護層によって覆われた第３面と、を備え、前記第１保護層、第２保護層および第３保護層のそれぞれは、１つ以上の層によって構成され、前記第１保護層の層数が、前記第２保護層および前記第３保護層のそれぞれの層数以下である。【選択図】図１