SPUTTERING APPARATUS AND FILM DEPOSITION METHOD

To provide a sputtering apparatus suitable for depositing a hexagonal crystal film having less crystal defects and excellent in crystal orientation by a sputtering method.SOLUTION: A sputtering apparatus includes a vacuum chamber 1 arranging a target 31 and a conveyance unit 7 for conveying a substr...

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Main Authors HAYASAKA RYOICHIRO, NUMATA YUKINOBU, TAKEUCHI MASAHITO, FUJINAGA TETSUSHI, HANNA TAKU
Format Patent
LanguageEnglish
Japanese
Published 01.03.2024
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Summary:To provide a sputtering apparatus suitable for depositing a hexagonal crystal film having less crystal defects and excellent in crystal orientation by a sputtering method.SOLUTION: A sputtering apparatus includes a vacuum chamber 1 arranging a target 31 and a conveyance unit 7 for conveying a substrate Sg along the X axial direction so as to pass through a space above in the Z axial direction facing a sputtering surface 31a in the vacuum chamber. Control plates 6a and 6b having a width equal to or more than the length of the target in the Y axial direction, extended in the Z axial direction and standing before or after the target in the X axial direction can control the adhesion of sputtered particles having an angle formed with a film formation surface Sg1 and equal to or more than a predetermined value and obliquely incident to a substrate.SELECTED DRAWING: Figure 1 【課題】結晶欠陥の少なく、結晶配向性が良好な六方晶系の結晶膜をスパッタリング法により成膜することに適したスパッタリング装置を提供する。【解決手段】ターゲット31が配置される真空チャンバ1を備え、真空チャンバ内でスパッタ面31aを臨むZ軸方向上方の空間を通過するようにX軸方向に沿って基板Sgを搬送する搬送ユニット7を備える。ターゲットのX軸方向前後に、当該ターゲットのY軸方向長さと同等以上の幅を持つと共にZ軸方向に沿ってのびる規制板6a,6bを夫々立設し、成膜面Sg1とのなす角度が所定値以下となって斜入射するスパッタ粒子の基板への付着が規制板で規制されるように構成する。【選択図】図1
Bibliography:Application Number: JP20220130436