SUBSTRATE PROCESSING METHOD

To facilitate the lifting and lowering of a chuck, and the gripping and release of a substrate by the chuck.SOLUTION: A substrate W includes a first surface W1, and a second surface W2 closer to a chuck base 11 than the first surface W1. In a first step, a processing liquid is supplied to at least o...

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Bibliographic Details
Main Author NAKAI HITOSHI
Format Patent
LanguageEnglish
Japanese
Published 11.01.2024
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Summary:To facilitate the lifting and lowering of a chuck, and the gripping and release of a substrate by the chuck.SOLUTION: A substrate W includes a first surface W1, and a second surface W2 closer to a chuck base 11 than the first surface W1. In a first step, a processing liquid is supplied to at least one of the first surface W1 and the second surface W2 held by the chuck 12. In a second step, gas is supplied to a second surface W2 together with the first step or after the first step is completed. In the second step, the substrate W approaches the chuck base 11 as the chuck 12 moves while being rotated by the chuck base 11 while being held by the chuck 12.SELECTED DRAWING: Figure 3 【課題】チャックの昇降と、チャックによる基板の把持およびその解除との容易化。【解決手段】基板Wは第1面W1と、第1面W1よりもチャックベース11に近い第2面W2とを有する。第1工程において、チャック12に把持された第1面W1および第2面W2の少なくとも一方に対して処理液の供給が行われる。第2工程において、第1工程と共に、あるいは第1工程が終了してから、第2面W2に対するガスの供給が行なわれる。第2工程において、基板Wはチャック12に把持されながらチャックベース11によって回転しつつ、チャック12の移動によってチャックベース11へ近づく。【選択図】図3
Bibliography:Application Number: JP20230187573