IMAGING ELEMENT AND IMAGING DEVICE
To solve the problem in which: there is a control line for each cell in an imaging unit but the accumulation time of charges and readout of pixel signals between the cells are not minutely controlled.SOLUTION: An imaging element includes a plurality of semiconductor substrates that are stacked. The...
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Main Authors | , , , , |
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Format | Patent |
Language | English Japanese |
Published |
24.11.2023
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Subjects | |
Online Access | Get full text |
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Summary: | To solve the problem in which: there is a control line for each cell in an imaging unit but the accumulation time of charges and readout of pixel signals between the cells are not minutely controlled.SOLUTION: An imaging element includes a plurality of semiconductor substrates that are stacked. The semiconductor substrates include a first semiconductor substrate including a plurality of photoelectric conversion units for converting light into charges, and a second semiconductor substrate including a calculation unit that calculates a first evaluation value for performing an image process on a first signal based on a charge converted in at least a first photoelectric conversion unit among the photoelectric conversion units and a second evaluation value for performing the image process on a second signal based on a charge converted in at least a second photoelectric conversion unit among the photoelectric conversion units.SELECTED DRAWING: Figure 1
【課題】上記撮像ユニットにあって、セルごとに制御線がある。しかしながら、セル間での電荷の蓄積時間および画素信号の読み出しを細かく制御していない。【解決手段】積層された複数の半導体基板を備える撮像素子であって、複数の半導体基板は、光を電荷に変換する複数の光電変換部を有する第1半導体基板と、複数の光電変換部のうち、少なくとも第1光電変換部で変換された電荷に基づく第1信号に画像処理を行うための第1評価値と、複数の光電変換部のうち、少なくとも第2光電変換部で変換された電荷に基づく第2信号に画像処理を行うための第2評価値とを演算する演算部を有する第2半導体基板と、を有する。【選択図】図1 |
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Bibliography: | Application Number: JP20230172887 |